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Check Out the Newest Tool from McPherson!

Extreme Ultraviolet and Soft X-ray Grazing Incidence Spectrometer

McPherson designed Model 248/310G Grazing Incidence Spectrometers operate from less than 1 to 310-nm with a variety of gratings. They are optimal for use at less than 100 nm and work best in the Extreme Ultraviolet (EUV) and Soft X-ray wavelength range. The working range of these McPherson EUV Spectrometers provides generous overlap with Crystal and Normal Incidence Spectrometers. The Model 248/310G is a 1 meter focal length instrument that has excellent spectral resolution and high dispersion. It is a compactly built instrument.

The Model 248/310G features variable angles of incidence, built in filter holders and various single and multichannel detection schemes. High vacuum and ultra high vacuum (UHV) versions of the Model 248/310G EUV Spectrometer are available. McPherson provides stand-alone components or integrated systems such as complete EUV Reflectometers or Calibration Stations.

The McPherson Model 248/310G EUV Spectrometers are equipped with intensifiers to survey broad spectral regions for laser or plasma diagnostic applications. Calibration and analysis of materials is possible. Mounting an x-ray or hollow cathode source turns the instrument into a tunable monochromatic source.

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