High resolution spectrometer for emission, luminescence, Raman (strained Silicon), and high temperature plasmas easily measure better than 0.02 nanometer full width half maximum spectra. McPherson’s high resolution spectrometer, Model 2061, is now available for scanning and imaging applications via two dimensional CCD or CMOS detectors. The one meter focal length spectrometer features bilaterally adjustable slits, multiple entrance and exit port locations, and high precision wavelength drive for unparallel reproducibility. Capability to mount large, high angle Echelle type diffraction gratings is built in. The large, 50mm wide focal plane is readily accessible.

Oversize McPherson Snap-In™ gratings fitting the one meter Model 2061 provide 40% more diffractive ruled area. Matching, focusing and collimating optics provide excellent light throughput and operation with f/7 aperture. The patented Snap-In™ gratings are easily interchangeable. Many diffraction gratings are available to tailor systems for a wide-spectral range or desired spectral resolution. Spectral resolution with a ten micron entrance slit and a 1200g/mm grating is better than 0.02nm full width half maximum.