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Spectral Reflectometer
Vacuum or purge reflectometer chamber for multiple samples (use with VUVaS spectrophotometer)
How do you measure irregular or diffractive optical samples?
Measure absorbance, transmittance and reflectance of diverse optical samples. Units are available for the Vacuum and Extreme UV as well as for purge, and UV-Vis, IR. The stainless steel reflectometer accepts samples up to 350-mm in diameter. Samples may be measured from 5 to 180-degrees with corresponding detector angles from 10 to 180-degrees. Theta / 2-theta measurements and off-specular scatter measurements are allowed and some units are available with integrating spheres for diffuse measurements. Heated sample holders are available and measurements may be performed under vacuum, purged or atmospheric environments.
The McPherson Spectral Reflectometer does spectral analysis in the 120 to 380nm range with better than 0.1% precision with wavelength resolution variable from 0.1 to 8nm. The design features include high efficiency optical systems, collimated sample probe beam, balanced and equal sample and reference path (true dual beam mode) and high gain photomultiplier detectors for optimum signal to noise.