Flat Field for XUV,
Soft X-ray and Extreme Ultraviolet (EUV)
  • Aberration corrected gratings
  • Flat field for direct detection with MCP or CCDs
  • Rapid spectral data collection
  • High Vacuum capability to 10^-6 torr
  • Ultra High Vacuum (UHV) - optional
  • Operates in any orientation
  • Available complete with detectors
XUV flat field Model 251MX Spectrometer


McPherson Model 251MX aberration corrected flat field spectrometer uses spherical substrate gratings with aspheric wave-front recording for an aberration corrected, high resolution spectrometer working through the soft x-ray region. Ideal for extreme UV (EUV) analysis, long focal length and straight spectral lines provide good spectral resolution. The Model 251MX delivers easy access to the best grating performance. High quality gratings are readily available. The Model 251MX is well suited to use CCD detectors for direct detection of the high-energy spectra. Microchannel plate (MCP) intensifiers can be reserved for those systems requiring gating.

McPherson Model 251MX Spectrograph
Focal Plane Length~25mm
Angle of Incidence87 degrees (<3 degrees grazing)
Detector Positioncontinuously variable, rotatable
Grating Mount2-position, adjustable in vacuum
Zero Order Bafflestandard, adjustable in vacuum
Entrance Slitcontinuously variable from 10um to 3mm,
adjustable in vacuum
Wavelength Rangerefer to grating of interest for range


Model 251MX Grating Selection (up to 2-gratings may be installed)
Deviation Angle
Degrees
G/mm Resolution
(nm)
Focal Plane
Width (mm)
Spectral Range
(nm)
Spectral Range
(eV)
167 1200 ~ 0.028 25 5 to 20 248 to 62
172 2400 ~ 0.01 20 1 to 5 1240 to 248


Data Sheet for the soft x-ray spectrometer Model 251MX available here

Model 251MX for 1 to 5nm with the 2400g/mm grating (click to enlarge) Model 251MX for 5 to 20nm with the 1200g/mm grating (click to enlarge) Model 642 light source on 251MX entrance slit


Data above was collected with direct detection CCD. We used the Model 642 x-ray source with easily exchanged anodes for focusing and resolution testing.

McPherson, Inc. produces spectrometers for work in the Extreme Ultraviolet and Soft X-ray wavelength regions. Consider a flat-field XUV spectrometer for work in a dedicated wavelength range. Examples when this may be practical include the development of high harmonic generation (HHG) laser sources, laser excited or other plasma sources for Extreme Ultraviolet Lithography (EUVL), and diagnostics of short life-time plasmas in tokamak or other experimental devices. For greater flexibility, or astrophysics instrument calibration (for example) consider the Rowland circle design grazing incidence system Model 248/310G. It provides most flexibility with respect to wavelength range. Many grating choices are available and it delivers excellent spectral resolution.