New from McPherson
February 2010 - McPherson, Inc. delivers an Infrared Spectral Test and Calibration System that helps the Naval Air System Command characterize diverse optical sensor ranges and formats. The system helps to characterize and document the response of sensors to specific wavelengths of light in order to calibrate their response and acquire useful data when the spectral sensors are airborne. The McPherson STS enables spectral test and characterization of various and diverse sensor and seeker formats. Among other tasks, McPherson STS helps NAVAIR characterize sensors for the SPIKE program. SPIKE is a low cost "fire and forget" precision guided technology utilizing high-tech imaging and electro-optical sensors.
January 2010 - Ultraviolet Radiation Spectrometer Quickly and easily measure vacuum ultraviolet spectral emission (signature emission from He, Ar, Xe, N2, O2, etc. and even many corrosive fluoride or chloride-based mixtures) in experiments as diverse as: plasma process mapping (semiconductor etch plasma formation and distribution), fluorescence (nano- materials, doped crystals, etc), luminescence (phosphor characteristics), and VUV photoemission. McPherson’s vacuum ultraviolet spectrometer, Model 234/302, is now complete with sensitive, cooled, scientific grade CCD detectors.
September 2009 - Spectrophotometer for Deep and vacuum ultraviolet, measurements have never been better, or easier! The McPherson VUVAS (pronounced voo-vas) is a broadly useful instrument for analysis, characterization, and test of ultraviolet materials, optics, non-linear and other crystals, as well as basic research in the sensitive and selective UV wavelength region. The VUVAS makes wavelength dispersed spectral measurements from 120 to 350nm (3.5 to 10eV.) VUVAS datasheet.
January 2009 - X-ray, EUV Spectrometer enables simultaneous spectral detection over a wide spectral range, reduces calibration errors, and increases the amount of data collected in a given amount of time. With it's two flat-field gratings, the McPherson 251MX Spectrometer can simultaneously detect 200 to 2000eV or 60 to 250eV!
July 2008 - Ultraviolet Photon Excitation system provides ready access to the vacuum-ultraviolet (VUV) for luminescence, material analysis, spectral calibration and photo-excitation spectroscopy. The system provides easily selectable wavelength, adjustable spectral band pass and standard vacuum flange interface, for easy implementation in product and performance testing.
April 2008 - VUV Optical Characterization System: McPherson, Inc. received a contract from the Optical Crystals group in the Solid State Physics Division of the Institute of Physics and Academy of Science (Czech Republic.) Under the contract, McPherson fabricated and delivered a vacuum ultraviolet spectrometer system to measure and characterize the optical and luminescence properties of optical crystals, films and single crystals (alkali halides, microcrystalline precipitates.)
March 2008 - Vacuum Ultraviolet Light-Source, 30nm+ The McPherson vacuum ultraviolet, hollow-cathode light source suitable for wavelength calibration, ultraviolet photoemission spectroscopy (UPS) and other vacuum ultraviolet spectroscopy applications. This continuous gas-discharge lamp is used with inert molecular or rare gases.
February 2008 - Vacuum XUV Spectrometer, 10 to 1000 eV, Model 248/310, for work through the vacuum ultraviolet including the extreme UV (XUV) and soft x-ray wavelength regions. It comes with vacuum tight seals for the 10-6 torr vacuum region. Research worldwide for attosecond laser pulses, compact extreme ultraviolet lasers and high harmonic lasers generation benefit from McPherson spectrometers ability to quickly and accurately provide XUV wavelength information.
January 2008 - McPherson delivers very High-Resolution-Raman-Spectrometers featuring 2m focal length, large masterpiece reflective optics used for spectral agility and wide-wavelength-range optical performance. Unique focal plane formation covers about 12" in wavelength space. Spectral resolution of about 10 to 15 picometer full width half maximum is attained totally across the large focal plane.